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E.V. Panfilova, A.B. Syritsky, A.A. Dobronosova
10
Engineering Journal: Science and Innovation
# 1·2018
Application of scanning probe microscopy
in the research of opal nanostructures
© E.V. Panfilova, A.B. Syritsky, A.A. Dobronosova
Bauman Moscow State Technical University, Moscow, 105005, Russia
The article describes the results of the research of formation of multilayer structures
based on opal films, using scanning probe microscope Solver P-47 by means of atomic
force and tunneling microscopy and current spectroscopy. The research shows that tun-
neling microscopy methods are suitable for studying chromium-opal-gold-carbon layered
structures. Surface images and current-voltage characteristics of each layer obtained in
the process of forming structures are shown. Results suggest that the formation of film
structures on the surface of opal matrices begins with the formation of “islands” on tops
of silica spheres. Findings of the research show that the deposition of carbon films on the
surface of the chrome-opal-gold structure results in tunnel current increase in the probe-
sample gap. The presented results can be used in the development of technology for the
formation of various layered structures on the surface of opal matrices, in particular, in
the production of photonic devices, sensors and emission devices.
Keywords:
opal, opal matrix, thin films, carbon structures, vapor-phase deposition,
scanning probe microscopy, tunnel electron microscopy, current spectroscopy
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