Engineering Journal: Science and InnovationELECTRONIC SCIENCE AND ENGINEERING PUBLICATION
Certificate of Registration Media number Эл #ФС77-53688 of 17 April 2013. ISSN 2308-6033. DOI 10.18698/2308-6033
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In situ Laser interferometric holoellipsometry with normal and brewster reflections of light

Published: 19.10.2013

Authors: Ali Mohammed , Kachurin Yu.Yu., Kirjanov A.P.

Published in issue: #7(19)/2013

DOI: 10.18698/2308-6033-2013-7-836

Category: Instrumentation | Chapter: Optical engineering

    ellipsometry, Michelson interferometer, binary modulation of polarization, uniaxial bi-dimensional crystal
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