Laser reflectometric measuring method of thickness and growth data of the nanofilms of gold on quartz substrate at the evaporation process
Published: 17.12.2012
Authors: Gorodnichev V.A., Belov M.L., Belov A.M., Fedotov Yu.V.
Published in issue: #9(9)/2012
DOI: 10.18698/2308-6033-2012-9-354
Category: Instrumentation | Chapter: Optical engineering
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